Scintillation Detectors (Scintillation Coatings on Imaging and Line Sensors)
Generally speaking phosphor coatings are used for the visualisation of energetic photons, Soft X-ray imaging, synchrotron radiation. The phosphor coating is prepared by sedimentation of phosphor grains on a solid state sensor like CCD or CMOS Sensor. Since these sensors are usually not sensitive for a wavelength < 350nm the coating acts as a spectral converter in most cases to green light. Coated solid state sensors are a much less expensive alternative to back thinned sensors if the other advantages of these sensors are not necessary for the application.
Our sedimentation process leads to a very homogeneous layer structure. To guarantee a homogeneous layer structure, at least 3 to 4 layers of phosphor grains are necessary. The minimum average grain size available is 1 µm. The maximum thickness of the phosphor coating is up to ca. 25µm.
The resolution limit RL is defined as the spatial frequency resulting in a modulation transfer function MTF with a value of 3%. RL is measured in linepairs/mm (lp/mm) and can be approximated as RL = 500/D (D as the thickness of the phosphor layer in µm). Up to 80lp/mm are possible.
Beam profile analysis
Soft X-ray detection
P43, P46, P47, P11 and other scintillators
segmentation of the coating area possible
Sensor sizes 100x100mm²
coating of line and area CCD/CMOS elements without protection window (Removing of the window is provided as a service)
coating thickness up to 30µm
Besides the standard configuration we do also take into account application-specific requirements. Thus we invite our customers to provide such information. Confidentiality is of course guaranteed.
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